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应用于红外成像或监控、红外测温、遥测等光学系统 |
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技术要求 |
商业级 |
精密级 |
高精密级 |
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尺寸范围 |
1-600mm |
2-600mm |
2-600mm |
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直径公差 |
土0.1mm |
土0.025mm |
土0.01mm |
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厚度公差 |
土0.1mm |
土0.025mm |
土0.01mm |
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中心偏差 |
±3´ |
±10´´ |
±2´´ |
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表面质量 |
60-40 |
40-20 |
20-10 |
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表面精度 |
1.0λ |
λ/10 |
λ/20 |
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镀 膜 |
3-5μmOR 8-12μm T >97% |
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倒 边 |
0.1-0.5mm*45° |
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材 料 |
单晶锗 |
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直径mm |
厚度mm |
镀膜要求 |
直径mm |
厚度mm |
|
10 |
1 |
AR/AR OR AR/DLC 3-5μm OR 8-12μm AR, <2% per Surface
|
75 |
3 |
|
12.5 |
1 |
75 |
5 |
|
|
20 |
2 |
76.2 |
6 |
|
|
25 |
3 |
80 |
8 |
|
|
30 |
3 |
90 |
10 |
|
|
38.1 |
3 |
100 |
10 |
|
|
40 |
4 |
150 |
15 |
|
|
50 |
3 |
180 |
18 |
|
|
50.8 |
3 |
200 |
20 |
|
|
63.5 |
5 |
300 |
35 |
